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atomic force microscopeAtomic force microscope (AFM) is a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of an Angstrom
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atomic force microscopeA scientific instrument that can generate images of nanoscale details on a physical surface by scanning a tiny, flexible ceramic or semiconductor probe just above the surface—where it will be attracte [..]
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atomic force microscopea powerful tool to manipulate matters at the nanoscale. It is today used for imaging a wide range of surfaces such as glass, composites, ceramics, polymers and biological samples. AFM finds increasing [..]
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atomic force microscopeAn instrument that uses a tiny probe to ‘feel’ a surface and map its atoms.
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atomic force microscopeAn instrument able to image surfaces to molecular accuracy by mechanically probing their surface contours. A kind of proximal probe.
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atomic force microscope also designated "Scanning Force Microscope (SFM)" Developped in 1986 by Gerd Binnig et al. The principle is the measurement (usually by laser scanning) of the movement of a nano-scale needle. The principle enables to separate structures of minimum 0,1 nm distance under optimal conditions what enables the visualization of single a [..]
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